SUPERAID7 - Events

2018 IEEE International Electron Devices Meeting (IEDM 2018)

December 1-5, 2018, San Francisco, United States

The following presentation reported on results of SUPERAID7:
S. Barraud et al., Tunability of Parasitic Channel in Gate-All-Around Stacked Nanosheets
in: Session 21 (Tuesday, December 4, 2:15 pm, Continental Ballroom 5): Process and Manufacturing Technology - Advanced Gate All Around Process

International Workshop on Timing Modeling, Organization and Simulation (PATMOS 2016) in conjunction with the European Workshop on CMOS Variability (VARI 2016)

September 21 to 23, 2016, Bremen, Germany

Presentation by J. Lorenz on SUPERAID7