Workshop at ESSDERC 2018

SUPERAID7 Workshop: "Process Variations from Equipment Effects to Circuit and Design Impacts"
Dresden, September 3, 2018

Welcome and orientation
J. Lorenz, Fraunhofer IISB

Process variability and the SUPERAID7 approach
J. Lorenz, Fraunhofer IISB

Statistical variability analysis in 28 nm UTBB FDSOI devices
A. Juge, STMicroelectronics

Variability-aware topography simulation
E. Bär, Fraunhofer IISB

Physical models for nanowire device simulation

V. Georgiev, University of Glasgow

Simulation of nanoscale interconnects
L. Filipovic, TU Wien

Variability-aware simulation of nanoscale devices
A. Asenov, V. Georgiev, University of Glasgow

LETI-NSP: advanced compact models for nanowire devices
O. Rozeau, CEA/Leti

Simulation tools for DTCO of advanced technology nodes
C. Millar, Synopsys

3D devices: experiments and simulation
S. Barraud, CEA/Leti

J. Lorenz, Fraunhofer IISB